DAC 2018 - Paper Details

← Session 7: Finding Patterns and Inferences

Designer Track Reviewed

7.3 - An Automated Methodology for Optimizing Lithography Weak-Points using Partial Pattern Matching Technique

3:30 PM–5:00 PM Jun 25, 2018 (America - Los Angeles)

Author (6)

Zhao Chuan Lee

Dr. Yongfu LI

Member of Technical Staff Engineer (Design for manufacturability) and Circuit Design EngineerGLOBALFOUNDRIES

Jonathan Yoong Seang Ong

Valerio Perez

MTS Design Enablement DFM developmentGLOBALFOUNDRIES Pte Ltd Singapore

Vikas Tripathi

MTSGLOBALFOUNDRIES SINGAPORE

Tags

Event Type Designer Track Reviewed

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Keywords Low-Power & Reliability

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Keywords Physical Design & DFM

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Topic Area Design

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