IP Track Invited

Session 9: Test and Yield Issues for IP in Complex SoCs

3:30 PM–5:00 PM Jun 25, 2018 (America - Los Angeles)

Room 2008

Achieving good testability and yield is often considered a problem that needs to be addressed at the IP level. However, system complexity, a heterogeneous IP portfolio, new technology constraints and the need to balance die size, performance and test cost also make it necessary to look at this problem from a SoC architecture and IP integration point of view. The presentations in this session sample some of the angles from which the issue can be addressed